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Journal Articles
2024
1. C K Dabhi, D Rajasekaran, G Pahwa, D Nandi, N Karumuri, S Turuvekere, A Dutta, B Swaminathan, S Srihari, Y S Chauhan, C Hu, “Symmetric BSIM-SOI Part-I: A Compact Model for Dynamically Depleted SOI MOSFETs”, IEEE Transactions on Electron Devices, 2024, doi: 10.1109/TED.2024.3363110.
2. C K Dabhi*, D Nandi*, K Nandan, D Rajasekaran, G Pahwa, N Karumuri, S Turuvekere, A Dutta, B Swaminathan, S Srihari, Y S Chauhan, S Salahuddin, C Hu, “Symmetric BSIM-SOI Part-II: A Compact Model for Partially Depleted SOI MOSFETs”, IEEE Transactions on Electron Devices, 2024, doi: 10.1109/TED.2024.3363117. [*equal contribution]
Conference Papers:
2017:
1. G. Kumar, M. Singh, G Trivedi, D Nandi "Bandgap generation in 2D materials", IEEE conference on Devices for Integrated Circuit (DevIC), 2017, doi: 10.1109/DEVIC.2017.8074011
2024:
1. D. Nandi, C. K. Dabhi, D. Rajasekharan, N. Karumuri, S. Turuvekere, B. Swaminathan, S. Srihari, A. Dutta, C. Hu and Y. S. Chauhan "Validation of Dynamically Depleted Symmetric BSIM-SOI Compact model for RF SOI T/R Switch Applications," 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Bangalore, India, 2024, pp. 1-3, doi: 10.1109/EDTM58488.2024.10512295.
2. Y. H. Zarkob, A. Sharma, G. Pahwa, D. Nandi, C. Dabhi, V. Kubrak, B. Peddenpohl, M. Tang, C. Hu and Y. S. Chauhan "Compact Modeling and Experimental validation of Reverse Impact Ionization in LDMOS transistors within the BSIM-BULK framework", 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Bangalore, India, 2024, pp. 1-3, doi: 10.1109/EDTM58488.2024.10512085.
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